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Peer-reviewed papers featuring Semilab technology.
334 publications found
Author: András Bojtor, Dávid Krisztián, Gábor Paráda, Ferenc Korsós, Sándor Kollarics, Gábor Csősz, Bence G. Márkus, László Forró, Ferenc Simon
Topic: Carrier generation & recombination; Metrology; Optoelectronics; Photoconductivity; Radio frequency techniques; Devices; Semiconductors; Microwave techniques
Author: Tamás Tarjányi, Csaba Rosztóczy, Ferenc Peták, Fruzsina Kun-Szabó, Gábor Gulyás, József Tolnai, Krisztián Bali, Petra Somogyi, Rebeka Anna Kiss, Gergely H. Fodor
Topic: nanoindentation; diabetes mellitus; rib bone; dynamic loading; aging; IND
Author: Tamás Tarjányi, Gábor Gulyás, Krisztián Bali, Márton Sámi, Rebeka Anna Kiss, Barbara Beiler, Péter Fürjes, Tibor Szabó
Topic: nanoindentation; hardness; creep; wafer; SU-8; epoxy
Author: Xian Xiao, Aimei Yang, Hanbin Zhang, Demian Park, Yangdong Wang, Balint Szabo, Edward S. Boyden, Kiryl D. Piatkevich
Topic: infrared; voltage measurement
Author: Baekmin Q. Kim, Zachariah Vicars, Máté Füredi, Lilia F. Escobedo, R. Bharath Venkatesh, Stefan Guldin, Amish J. Patel, Daeyeon Lee
Topic: ellipsometry; spectroscopic ellipsometry; spectroscopic ellipsometry; mapping; in-situ heating; vacuum chamber; NANO SURFACE CHARACTERIZATION
Author: D. Ullrich, Z. Bozóki, B. M. Kovács, Ö. Sepsi, F. Ujhelyi, Z. Zolnai, J. Szivós, G. Nádudvari, L. Balogh
Topic: Ion Implantation; Photomodulated Reflection measurements; Silicon (Si); silicon carbide (SiC); ION IMPLANT MONITORING
Author: Baekmin Q. Kim1†, Zachariah Vicars1†, Máté Füredi2,3, Lilia F. Escobedo1, R. Bharath Venkatesh1‡, Stefan Guldin2,4,5, Amish J. Patel1*, Daeyeon Lee1
Topic: spectroscopic ellipsometry
Author: Emőke Albert*; Péter Basa, Bálint Fodor; Zsófia Keresztes, János Madarász, Péter Márton, Dániel Olasz, Adél Sarolta Rácz, György Sáfrán, Tamás Szabó, Borbála Tegze, Tibor Höltzl, Zoltán Hórvölgyi
Topic: EP (ellipsometric porosimetry)
Author: R. J. Quinn1, Y. Go2, A.B. Naden 3, A. Bojtor, G. Paráda, A. K. M. A. Shawon 5, K. Domosud 6, K. Refson 6, A. Zevalkink 5, N. Neophytou 2, J. W. G. Bos 3
Topic: Hall effect
Author: Adam J. Lovett*, Máté Füredi, Liam Bird, Samia Said, Brandon Frost, Paul R. Shearing, Stefan Guldin, Thomas S. Miller*
Topic: spectroscopic ellipsometry
Author: András Bojtor, Dávid Krisztián, Gábor Paráda, Ferenc Korsós, Sándor Kollarics, Gábor Csősz, Bence G. Márkus, László Forró, Ferenc Simon
Topic: uPCD
Author: Maximiliano Jesus Jara Fornerod, Alberto Alvarez-Fernandez, Máté Füredi, Anandapadmanabhan A Rajendran, Beatriz Prieto-Simón, Nicolas H. Voelcker, Stefan Guldin
Topic: spectroscopic ellipsometry
Author: Tamas Tarjanyi, Andras Gabor Jakab, Marton Sami, Krisztian Bali, Ferenc Rarosi, Maja Laura Jarabik, Gabor Braunitzer, Daniel Palkovics, Lippo Lassila, Edina Lempel, Mark Frater, Sufyan Garoushi
Topic: nanoindentation; COMPOUND MATERIAL CHARACTERIZATION
Author: Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh
Topic: adhesion assay; Zeiss AFM; single-cell force spectroscopy
Author: Mikio Fukuhara, Tomonori Yokotsuka, Tetsuo Samoto, Masahiko Kumadaki, Mitsuhiro Takeda, Toshiyuki Hashida
Topic: Hall effect measurements; Materials science; Organic contamination; semiconductor; semiconductor materials; Semiconductor Devices; NANO HARDNESS; PDL Hall
