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The SRP-170 is a cost-effective, spreading resistance profiler designed for silicon semiconductor dopant and resistivity profiling. Ideal for universities, research institutes, and low-volume analytical labs, it offers reliable performance with manual loading and expert-guided operation. Additional sample preparation kit for in-house sample preparation included.
SRP-170 Spreading Resistance Profiling
Author: Samu Viktor, Kerekes Árpád, Pongrácz Anita, Durkó Zsolt
Topic: microPL; JPV; photo-modulated reflectance
Author: E. E. Najbauer, L. Sinkó, Sz. Biró, Z. Durkó, P. Basa
Topic: carrier density; epitaxial layer; semiconductor; Silicon (Si); SRP-2100; SRP; FTIR REFLECTOMETRY
SRP-170 Spreading Resistance Profiling
