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This high-performance, non-contact, non-destructive optical metrology tool provides precise measurement of thin film thickness and optical constants across single and multilayer structures. Designed for R&D labs, universities, and industries like semiconductor, PV and optics, it supports advanced modeling, mapping, and real-time data visualization.
inSE-1000 Spectroscopic Ellipsometry
Author: Lenke Kócs, Borbála Tegze, Emőke Albert, Csaba Major, András Szalai, Bálint Fodor, Péter Basa, György Sáfrán, Zoltán Hórvölgyi
Topic: porous silica coatings; spectroscopic ellipsometry; ELLIPSOMETRIC POROSIMETRY; mesoporous; anti-reflective coatings
Author: Baekmin Q. Kim1†, Zachariah Vicars1†, Máté Füredi2,3, Lilia F. Escobedo1, R. Bharath Venkatesh1‡, Stefan Guldin2,4,5, Amish J. Patel1*, Daeyeon Lee1
Topic: spectroscopic ellipsometry
Author: P. Basa, B. Fodor, Zs. Nagy, B. Oyunbolor, A. Hajtman, S. Bordács, I. Kézsmárki, A. Halbritter, Á. Orbán
Topic: ellipsometry; rotating compensator; mueller matrix; spectroscopic ellipsometer
Author: Máté Füredi, Cristina V. Manzano, András Marton, Bálint Fodor, Alberto Alvarez-Fernandez,*
Topic: EP
Author: Maximiliano Jesus Jara Fornerod, Alberto Alvarez-Fernandez, Máté Füredi, Anandapadmanabhan A Rajendran, Beatriz Prieto-Simón, Nicolas H. Voelcker, Stefan Guldin
Topic: spectroscopic ellipsometry
Author: Balogh Imre, Kiss Roberta Zsófia, Egri Dávid
Topic: spectroscopic ellipsometry
Author: Máté Füredi, Bálint Fodor, András Marton, Alberto Alvarez-Fernandez, Aysha ARiaz, Curran Kalha, Anna Regoutz, Stefan Guldin, Péter Basa
Topic: Ellipsometers; ellipsometry; ellipsometry porosimetry; ELLIPSOMETRIC POROSIMETRY; ELLIPSOMETRIC POROSIMETRY (R&D); Mesoporous silica films; Porosimetry; mesoporous
Author: Emeric Balogh, Peter Basa, Attila Suto, Benjamin Powell, Anna Bölcskei-Molnár, and Szilvia Biró
Topic: ellipsometry; spectroscopic ellipsometry
Author: Akshay Singh, Yifei Li, Balint Fodor, Laszlo Makai, Jian Zhou, Haowei Xu, Austin Akey, Ju Li and R. Jaramillo
Topic: ellipsometry; visible spectra; Transmission electron microscopy; Density functional theory; Photonic integrated circuits; Transition metal chalcogenides; Optical metrology; Crystalline solids; Optical electronics
Author: Máté Füredi, Alberto Alvarez-Fernandez, Maximiliano Jesus Jara Fornerod, Bálint Fodor, and Stefan Guldin
Topic: spectroscopic ellipsometry; EP
Author: László Makai, Benjamin Kalas, György Tiborcz
Topic: Ellipsometers; ellipsometry; Interfaces; spectroscopic ellipsometry; Surface; Surface measurement
Author: Adam J. Lovett*, Máté Füredi, Liam Bird, Samia Said, Brandon Frost, Paul R. Shearing, Stefan Guldin, Thomas S. Miller*
Topic: spectroscopic ellipsometry
Author: Aysha A. Riaz, Curran Kalha Maria Basso, Máté Füredi, Anna Regoutz
Topic: spectroscopic ellipsometry
inSE-1000 Spectroscopic Ellipsometry
