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Four-Point Probe MeasurementResistivity Measurement

FPP-1006 Four-Point Probe Measurement

The FPP-1006 is designed for precise measurement of resistivity, emitter sheet resistance, and doping density in semiconductor wafers, thin films, and solar cells, using a 6-electrode contact probe that eliminates contact resistance effects. It is ideal for PV industry standards and semiconductor R&D.

FPP-1006 Four-Point Probe Measurement

Related Publications

IEEE Photovoltaic Specialists Conference, IEEE NewYork 2000.) p 99.2000

Lifetime mapping of Si Wafers by an Infrared Camera

Author: M. Bail, J. Kentsch, R. Brendel, M. Schulz

Topic: carrier lifetime; infrared camera

Read publication

FPP-1006 Four-Point Probe Measurement

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