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Contactless Resistivity MappingResistivity Measurement

COREMA-2000 Contactless Resistivity Mapping

The COREMA-2000 series offers precise, non-destructive, contactless resistivity measurement solutions designed primarily for semi-insulating compound semiconductors such as SiC, GaN, GaAs, CdTe, GaO, and InP. It supports both research and industrial semiconductor manufacturing environments with high accuracy and repeatability.

COREMA-2000 Contactless Resistivity Mapping

Related Publications

Materials Science and Engineering, B41989

Dispersive Microwave Transient Spectroscopy of Deep Levels in Semiconductors

Author: D. Huber, P. Eichinger, G. Ferenczi, T. Pavelka, G. Veszely

Topic: Microwave transient spectroscopy; deep levels; semiconductor

Read publication

COREMA-2000 Contactless Resistivity Mapping

Related Whitepapers

From GaAs to SiC: Measuring Resistivity in Compound Semiconductors

September 23, 2025

From GaAs to SiC: Measuring Resistivity in Compound Semiconductors