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The AFM-2000 is Semilab’s high-end atomic force microscope, delivering high-resolution, sub-atomic precision measurements for both academic research and semiconductor industry applications. Ideal for surface roughness and critical dimension control, it offers a large sample stage movement range of 200 × 250 mm with full automation capability—making it ideal for both R&D and industrial quality control.
AFM-2000 Atomic Force Microscopy
Author: L. Quattropani, K. Solt, P. Niedermann, I. Maggio-Aprile, O. Fischer, T. Pavelka
Topic: Schottky diode; RF plasma treated silicon
Author: Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh
Topic: adhesion assay; Zeiss AFM; single-cell force spectroscopy
Author: D. Marinskiy, P. Edelman, A.D. Snider
Topic: Kelvin force microscopy; corona charge; concentration profile; surface diffusion
Author: Dmitriy Marinskiy, Patrick Polakowski, Jacek Lagowski, Marshall Wilson, Piotr Edelman, Johannes Müller
Topic: corona - Kelvin; Non-Contact Measurement; THIN FILM CHARACTERIZATION
Author: P.M. Nagy, D. Aranyi, P. Horváth, G. Pető, E. Kálmán
Topic: nanoindentation; Ion Implantation; mechanical properties; AFM
AFM-2000 Atomic Force Microscopy
