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The AFM-1000 from Semilab is a versatile atomic force microscope designed for both academic research and semiconductor industry applications. This compact system offers high-resolution, sub-atomic precision measurements with extremely low noise levels, ideal for consistent nanotopography measurements and electrical characterization of various samples up to 65x65 mm in size.
With cutting-edge technology and decades of knowhow, Semilab tabletop AFM system provides to your academic research microscopic measurement solutions based on semiconductor industry standards.
AFM-1000 Atomic Force Microscopy
Author: Katalin Csonti, Csilla Fazakas, Kinga Molnár, Imola Wilhelm, István A. Krizbai, Attila G. Végh
Topic: adhesion assay; Zeiss AFM; single-cell force spectroscopy
Author: P.M. Nagy, D. Aranyi, P. Horváth, G. Pető, E. Kálmán
Topic: nanoindentation; Ion Implantation; mechanical properties; AFM
AFM-1000 Atomic Force Microscopy
